Catherine E. Campbell, Ph.D.
Noblis Principal
Presentation--Data Fusion and Collaboration:
Noblis Responds to the IEEE VAST Challenge

Noblis Technology Tuesdays
October 5, 2010

The 2010 Visual Analytics Science and Technology (VAST) Challenge is an analytical contest sponsored by the Institute of Electrical and Electronics Engineers (IEEE). The contest is intended to push the forefront of visual analytics tools using benchmark data sets, and establish a forum to advance visual analytics evaluation methods. Noblis won the Grand Challenge for Outstanding Debrief in the 2010 challenge which asked participants to examine connections between intelligence reports, health records, and genomics data. This presentation discusses Noblis' effort to respond to this challenge and the cross-company collaboration that was necessary to develop a successful response.

Learn more about Noblis'  VAST Challenge entry.